Characterization of the gate-voltage dependency of input capacitance in a SiC MOSFET
نویسندگان
چکیده
The charge/discharge phenomenon of capacitance between terminals in a power MOSFET affects on its switching behavior of the device. The input capacitance is composed of the gate-source capacitance CGS and the gate-drain capacitance CGD, which vary with gate voltage VGS. This paper characterizes the relationship between the input capacitance of a SiC MOSFET and the gate voltage with considering the internal device structure. The results give us a clue to understand the switching dynamics of the power MOSFET.
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ورودعنوان ژورنال:
- IEICE Electronic Express
دوره 7 شماره
صفحات -
تاریخ انتشار 2010